Heimann Sensor Expert talks about AI and Infrared Imaging at the Upcoming SMSI

The Sensor and Measurement Science International Conference SMSI 2025 will take place this year 6-8 May in Nuremberg and is related to the leading international trade fair Sensor+Test.

Our top expert regarding the integration of AI into the infrared imaging of sensor arrays will hold an informative presentation on May 6 at 12.30 pm, D1.4, about the Development of a Computationally Efficient Person Detection Procedure for Low-Resolution Infrared Sensor Arrays.

We would be happy to meet you at the SMSI and discuss this forward-thinking topic with you.