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Jewell Enters the JDI-100/200 into Tech Briefs Award Contest

Jewell Enters the JDI-100/200 into Tech Briefs Award Contest

10 July 2017

Jewell Instruments has entered the JDI-100/200 digital MEMS Inclinometer into the Electronics/Sensors/IOT category of Tech Briefs Create the Future 2017 Design Contest. Hundreds of manufacturers and inventors have entered their latest and most innovative product to compete in this contest. 

Other categories include aerospace & defense, automotive/transportation, consumer products, machinery/automation/robotics, medical and sustainable technologies. A group of 24 judges appointed by Tech Briefs Media Group will select the grand prize and category winners as well as the top 100 entries overall. 

The most popular entries will be determined by voting. The polls are open now and all winners will be announced in September.

The JDI-100/200 is the latest addition to Jewell Instruments’ group of MEMS sensors. Made in-house, this ruggedized inclinometer includes digital output and full temperature compensation across all measuring ranges which enables the unit to perform to 0.005° accuracy.

The JDI-100/200 series utilizes MEMS technology to measure tilt in either single (JDI-100) or dual-axis (JDI-200). ±1°, ±3°, ±14.5°, ±30° and ±60° are the standard measuring ranges with a 0.0001° digital resolution and RS485 interface output. It is also RoHS compliant to satisfy environmental standards.

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